International Journal of Computer Theory and Engineering

Abstract

Quantum cellular automata (QCA) is a new technology in nanometer scale as one of the alternatives to nano cmos technology, QCA technology has large potential in terms of high space density and power dissipation with the development of faster computers with lower power consumption. This paper proposes Fault tolerant Quantum cellular elementary Block type QCA logic gates and analysis its polarization values. The simulation is carried out using QCA designer tool and it was found that maximum displacement of34 nm for QCA input cells and 8 nm for QCA output cells of fault tolerant logic gate gives same results as that of the ordinary QCA logic gates. Further this analysis can be carried out for displacement of electron dots within the cells and study other device level parameters like radius of interaction cells, clocking zones of the cells, no of cell displacement in a clock zone and electron migration etc. Fault tolerance analysis applied here can be used to find the defective cell from its polarization value.